Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
Advanced photonic probes are important for the development of non-contact wafer-scale testing of photonic chips. Here, Vynck et al. develop a quantitative technique based on mapping of transmittance variations by ultrafast perturbations to analyze arbitrary linear multi-port photonic devices.
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| Autores principales: | , , , , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2018
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/dd5f4fa5772c4eeda483237d7571d2ec |
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