Unraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface

Cu(In,Ga)Se2 (CIGSe) is a promising absorber material for thin‐film photovoltaic devices. A key procedure to achieve high efficiencies is the application of alkali fluoride postdeposition treatments (PDT) of the CIGSe surface. While the effects of the PDT on the directly impacted CIGSe front surface...

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Autores principales: Jakob Bombsch, Enrico Avancini, Romain Carron, Evelyn Handick, Raul Garcia-Diez, Claudia Hartmann, Roberto Félix, Daniel Abou-Ras, Shigenori Ueda, Regan G. Wilks, Marcus Bär
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spelling oai:doaj.org-article:df08cea5475144f5a928b248133194ed2021-11-04T09:03:08ZUnraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface2699-941210.1002/aesr.202100101https://doaj.org/article/df08cea5475144f5a928b248133194ed2021-11-01T00:00:00Zhttps://doi.org/10.1002/aesr.202100101https://doaj.org/toc/2699-9412Cu(In,Ga)Se2 (CIGSe) is a promising absorber material for thin‐film photovoltaic devices. A key procedure to achieve high efficiencies is the application of alkali fluoride postdeposition treatments (PDT) of the CIGSe surface. While the effects of the PDT on the directly impacted CIGSe front surface have been subject to extensive studies, less is known about the impact on the deeply buried CIGSe/Mo interface. Exposing the CIGSe absorber backside by stripping it off the Mo back contact allows to use surface‐sensitive photoelectron spectroscopy to study the chemical and electronic structure of this interface in unprecedented detail. CIGSe /Mo stacks prepared using NaF only and combined NaF/RbF (with optimal and excess amount of RbF) PDT are studied. Rb is detected accumulating at the backside of the RbF‐treated CIGSe absorbers in conjunction with a depletion of Na. The exposed CIGSe backsides display a Cu‐deficient surface region, with increased presence of Rb correlating with a decreased Cu content. Rb appears to be incorporated into the Cu‐deficient absorber region as previously detected on the front surface. However, in contrast to the front surface, no distinct, secondary RbInSe‐type phase is found at the back surface.Jakob BombschEnrico AvanciniRomain CarronEvelyn HandickRaul Garcia-DiezClaudia HartmannRoberto FélixDaniel Abou-RasShigenori UedaRegan G. WilksMarcus BärWiley-VCHarticleback interfaceschalcopyrite thin-film solar cellsCu(InGa)Se2hard X-ray photoelectron spectroscopypostdeposition treatmentEnvironmental technology. Sanitary engineeringTD1-1066Renewable energy sourcesTJ807-830ENAdvanced Energy & Sustainability Research, Vol 2, Iss 11, Pp n/a-n/a (2021)
institution DOAJ
collection DOAJ
language EN
topic back interfaces
chalcopyrite thin-film solar cells
Cu(In
Ga)Se2
hard X-ray photoelectron spectroscopy
postdeposition treatment
Environmental technology. Sanitary engineering
TD1-1066
Renewable energy sources
TJ807-830
spellingShingle back interfaces
chalcopyrite thin-film solar cells
Cu(In
Ga)Se2
hard X-ray photoelectron spectroscopy
postdeposition treatment
Environmental technology. Sanitary engineering
TD1-1066
Renewable energy sources
TJ807-830
Jakob Bombsch
Enrico Avancini
Romain Carron
Evelyn Handick
Raul Garcia-Diez
Claudia Hartmann
Roberto Félix
Daniel Abou-Ras
Shigenori Ueda
Regan G. Wilks
Marcus Bär
Unraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface
description Cu(In,Ga)Se2 (CIGSe) is a promising absorber material for thin‐film photovoltaic devices. A key procedure to achieve high efficiencies is the application of alkali fluoride postdeposition treatments (PDT) of the CIGSe surface. While the effects of the PDT on the directly impacted CIGSe front surface have been subject to extensive studies, less is known about the impact on the deeply buried CIGSe/Mo interface. Exposing the CIGSe absorber backside by stripping it off the Mo back contact allows to use surface‐sensitive photoelectron spectroscopy to study the chemical and electronic structure of this interface in unprecedented detail. CIGSe /Mo stacks prepared using NaF only and combined NaF/RbF (with optimal and excess amount of RbF) PDT are studied. Rb is detected accumulating at the backside of the RbF‐treated CIGSe absorbers in conjunction with a depletion of Na. The exposed CIGSe backsides display a Cu‐deficient surface region, with increased presence of Rb correlating with a decreased Cu content. Rb appears to be incorporated into the Cu‐deficient absorber region as previously detected on the front surface. However, in contrast to the front surface, no distinct, secondary RbInSe‐type phase is found at the back surface.
format article
author Jakob Bombsch
Enrico Avancini
Romain Carron
Evelyn Handick
Raul Garcia-Diez
Claudia Hartmann
Roberto Félix
Daniel Abou-Ras
Shigenori Ueda
Regan G. Wilks
Marcus Bär
author_facet Jakob Bombsch
Enrico Avancini
Romain Carron
Evelyn Handick
Raul Garcia-Diez
Claudia Hartmann
Roberto Félix
Daniel Abou-Ras
Shigenori Ueda
Regan G. Wilks
Marcus Bär
author_sort Jakob Bombsch
title Unraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface
title_short Unraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface
title_full Unraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface
title_fullStr Unraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface
title_full_unstemmed Unraveling the Impact of Combined NaF/RbF Postdeposition Treatments on the Deeply Buried Cu(In,Ga)Se2/Mo Thin‐Film Solar Cell Interface
title_sort unraveling the impact of combined naf/rbf postdeposition treatments on the deeply buried cu(in,ga)se2/mo thin‐film solar cell interface
publisher Wiley-VCH
publishDate 2021
url https://doaj.org/article/df08cea5475144f5a928b248133194ed
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