Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy

Heterostructures of graphene and hexagonal boron nitride have great potential for high-mobility electronics, yet little is known about the electronic interaction between these two atomically thin materials. Here, the authors perform angle-resolved reflected-electron spectroscopy to unveil their inte...

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Autores principales: Johannes Jobst, Alexander J. H. van der Torren, Eugene E. Krasovskii, Jesse Balgley, Cory R. Dean, Rudolf M. Tromp, Sense Jan van der Molen
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2016
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Acceso en línea:https://doaj.org/article/e09a255f228345dca396bbfadf1c3f7e
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spelling oai:doaj.org-article:e09a255f228345dca396bbfadf1c3f7e2021-12-02T14:39:55ZQuantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy10.1038/ncomms136212041-1723https://doaj.org/article/e09a255f228345dca396bbfadf1c3f7e2016-11-01T00:00:00Zhttps://doi.org/10.1038/ncomms13621https://doaj.org/toc/2041-1723Heterostructures of graphene and hexagonal boron nitride have great potential for high-mobility electronics, yet little is known about the electronic interaction between these two atomically thin materials. Here, the authors perform angle-resolved reflected-electron spectroscopy to unveil their interplay.Johannes JobstAlexander J. H. van der TorrenEugene E. KrasovskiiJesse BalgleyCory R. DeanRudolf M. TrompSense Jan van der MolenNature PortfolioarticleScienceQENNature Communications, Vol 7, Iss 1, Pp 1-6 (2016)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
Johannes Jobst
Alexander J. H. van der Torren
Eugene E. Krasovskii
Jesse Balgley
Cory R. Dean
Rudolf M. Tromp
Sense Jan van der Molen
Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
description Heterostructures of graphene and hexagonal boron nitride have great potential for high-mobility electronics, yet little is known about the electronic interaction between these two atomically thin materials. Here, the authors perform angle-resolved reflected-electron spectroscopy to unveil their interplay.
format article
author Johannes Jobst
Alexander J. H. van der Torren
Eugene E. Krasovskii
Jesse Balgley
Cory R. Dean
Rudolf M. Tromp
Sense Jan van der Molen
author_facet Johannes Jobst
Alexander J. H. van der Torren
Eugene E. Krasovskii
Jesse Balgley
Cory R. Dean
Rudolf M. Tromp
Sense Jan van der Molen
author_sort Johannes Jobst
title Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
title_short Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
title_full Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
title_fullStr Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
title_full_unstemmed Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
title_sort quantifying electronic band interactions in van der waals materials using angle-resolved reflected-electron spectroscopy
publisher Nature Portfolio
publishDate 2016
url https://doaj.org/article/e09a255f228345dca396bbfadf1c3f7e
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