A Process-Aware Memory Compact-Device Model Using Long-Short Term Memory
With the immense increase in the processing data during the scaling down of semiconductor devices by Moore’s Law, it is in urgent need to use data analytics to meet the state of the art performance in both manufacturing and device compact modeling. In particular, managing the fabrication...
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| Main Authors: | , , , , , , , |
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| Format: | article |
| Language: | EN |
| Published: |
IEEE
2021
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| Subjects: | |
| Online Access: | https://doaj.org/article/e1529a89857f43f3ad53da5da0aca59b |
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