Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics

Abstract Individual authentication using artefact metrics has received increasing attention, as greater importance has been placed on the security of individual information. These artefact metrics must satisfy the requirements of individuality, measurement stability, durability, and clone resistance...

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Autores principales:	Shunya Ito, Toshiyuki Omori, Masao Ando, Hiroyuki Yamazaki, Masaru Nakagawa
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2021
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/e23c4b9d5798415291a98b856fc94e95
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spelling	oai:doaj.org-article:e23c4b9d5798415291a98b856fc94e952021-12-02T16:45:47ZPlastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics10.1038/s41598-021-95953-02045-2322https://doaj.org/article/e23c4b9d5798415291a98b856fc94e952021-08-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-95953-0https://doaj.org/toc/2045-2322Abstract Individual authentication using artefact metrics has received increasing attention, as greater importance has been placed on the security of individual information. These artefact metrics must satisfy the requirements of individuality, measurement stability, durability, and clone resistance, in addition to possessing unique physical features. In this study, we proposed that nanostructures of synthetic quartz (SQ) deposited on an SQ plate may provide sophisticated artefact metrics if morphological changes could be intentionally introduced into the SQ nanostructures at certain positions. We fabricated SQ nanopillars using a mass-production method (ultraviolet nanoimprint lithography) and investigated their mechanical deformation using nanoindentation with a spheroid diamond tip through a loading and unloading cycle. The SQ nanopillars with an aspect ratio of 1 (i.e., diameters D of 100 and 200 nm with corresponding heights H of 100 and 200 nm, respectively) could be plastically deformed without collapsing within a specified pillar-array format at programmed positions. The plastically deformed SQ nanopillar arrays demonstrated multi-scale (sub-millimetre, micrometre, and nanometre) and multi-level (shape, area, diameter, and height) individuality authentication and clone resistance. Because SQ is physically and chemically stable and durable, individuality authentication can be a highly reliable tool on Earth and in space.Shunya ItoToshiyuki OmoriMasao AndoHiroyuki YamazakiMasaru NakagawaNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-9 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Shunya Ito Toshiyuki Omori Masao Ando Hiroyuki Yamazaki Masaru Nakagawa Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics
description	Abstract Individual authentication using artefact metrics has received increasing attention, as greater importance has been placed on the security of individual information. These artefact metrics must satisfy the requirements of individuality, measurement stability, durability, and clone resistance, in addition to possessing unique physical features. In this study, we proposed that nanostructures of synthetic quartz (SQ) deposited on an SQ plate may provide sophisticated artefact metrics if morphological changes could be intentionally introduced into the SQ nanostructures at certain positions. We fabricated SQ nanopillars using a mass-production method (ultraviolet nanoimprint lithography) and investigated their mechanical deformation using nanoindentation with a spheroid diamond tip through a loading and unloading cycle. The SQ nanopillars with an aspect ratio of 1 (i.e., diameters D of 100 and 200 nm with corresponding heights H of 100 and 200 nm, respectively) could be plastically deformed without collapsing within a specified pillar-array format at programmed positions. The plastically deformed SQ nanopillar arrays demonstrated multi-scale (sub-millimetre, micrometre, and nanometre) and multi-level (shape, area, diameter, and height) individuality authentication and clone resistance. Because SQ is physically and chemically stable and durable, individuality authentication can be a highly reliable tool on Earth and in space.
format	article
author	Shunya Ito Toshiyuki Omori Masao Ando Hiroyuki Yamazaki Masaru Nakagawa
author_facet	Shunya Ito Toshiyuki Omori Masao Ando Hiroyuki Yamazaki Masaru Nakagawa
author_sort	Shunya Ito
title	Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics
title_short	Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics
title_full	Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics
title_fullStr	Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics
title_full_unstemmed	Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics
title_sort	plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics
publisher	Nature Portfolio
publishDate	2021
url	https://doaj.org/article/e23c4b9d5798415291a98b856fc94e95
work_keys_str_mv	AT shunyaito plasticdeformationofsyntheticquartznanopillarsbynanoindentationformultiscaleandmultilevelsecurityartefactmetrics AT toshiyukiomori plasticdeformationofsyntheticquartznanopillarsbynanoindentationformultiscaleandmultilevelsecurityartefactmetrics AT masaoando plasticdeformationofsyntheticquartznanopillarsbynanoindentationformultiscaleandmultilevelsecurityartefactmetrics AT hiroyukiyamazaki plasticdeformationofsyntheticquartznanopillarsbynanoindentationformultiscaleandmultilevelsecurityartefactmetrics AT masarunakagawa plasticdeformationofsyntheticquartznanopillarsbynanoindentationformultiscaleandmultilevelsecurityartefactmetrics
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Plastic deformation of synthetic quartz nanopillars by nanoindentation for multi-scale and multi-level security artefact metrics

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