Cita APA (7a ed.)

Radwan, M., Thiel, D. V., & Espinosa, H. G. (2021). Single-Sided Microwave Near-Field Scanning of Pine Wood Lumber for Defect Detection. MDPI AG.

Cita Chicago Style (17a ed.)

Radwan, Mohamed, David V. Thiel, y Hugo G. Espinosa. Single-Sided Microwave Near-Field Scanning of Pine Wood Lumber for Defect Detection. MDPI AG, 2021.

Cita MLA (8a ed.)

Radwan, Mohamed, et al. Single-Sided Microwave Near-Field Scanning of Pine Wood Lumber for Defect Detection. MDPI AG, 2021.