The electromigration effect revisited: non-uniform local tensile stress-driven diffusion

Abstract The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here,...

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Autores principales:	Shih-kang Lin, Yu-chen Liu, Shang-Jui Chiu, Yen-Ting Liu, Hsin-Yi Lee
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/e7e182a4b85c4c0994c957dfef0de697
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id	oai:doaj.org-article:e7e182a4b85c4c0994c957dfef0de697
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spelling	oai:doaj.org-article:e7e182a4b85c4c0994c957dfef0de6972021-12-02T16:06:37ZThe electromigration effect revisited: non-uniform local tensile stress-driven diffusion10.1038/s41598-017-03324-52045-2322https://doaj.org/article/e7e182a4b85c4c0994c957dfef0de6972017-06-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-03324-5https://doaj.org/toc/2045-2322Abstract The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here, we performed in situ current-stressing experiments for pure Cu strips using synchrotron X-ray diffractometry and scanning electron microscopy and ab initio calculations based on density functional theory. An intrinsic and non-uniform lattice expansion – larger at the cathode and smaller at the anode, is identified induced by the flow of electrons. If this electron flow-induced strain is small, it causes an elastic deformation; while if it is larger than the yield point, diffusion as local stress relaxation will cause the formation of hillocks and voids as well as EM-induced failure. The fundamental driving force for the electromigration effect is elucidated and validated with experiments.Shih-kang LinYu-chen LiuShang-Jui ChiuYen-Ting LiuHsin-Yi LeeNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-10 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Shih-kang Lin Yu-chen Liu Shang-Jui Chiu Yen-Ting Liu Hsin-Yi Lee The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
description	Abstract The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here, we performed in situ current-stressing experiments for pure Cu strips using synchrotron X-ray diffractometry and scanning electron microscopy and ab initio calculations based on density functional theory. An intrinsic and non-uniform lattice expansion – larger at the cathode and smaller at the anode, is identified induced by the flow of electrons. If this electron flow-induced strain is small, it causes an elastic deformation; while if it is larger than the yield point, diffusion as local stress relaxation will cause the formation of hillocks and voids as well as EM-induced failure. The fundamental driving force for the electromigration effect is elucidated and validated with experiments.
format	article
author	Shih-kang Lin Yu-chen Liu Shang-Jui Chiu Yen-Ting Liu Hsin-Yi Lee
author_facet	Shih-kang Lin Yu-chen Liu Shang-Jui Chiu Yen-Ting Liu Hsin-Yi Lee
author_sort	Shih-kang Lin
title	The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
title_short	The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
title_full	The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
title_fullStr	The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
title_full_unstemmed	The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
title_sort	electromigration effect revisited: non-uniform local tensile stress-driven diffusion
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/e7e182a4b85c4c0994c957dfef0de697
work_keys_str_mv	AT shihkanglin theelectromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT yuchenliu theelectromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT shangjuichiu theelectromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT yentingliu theelectromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT hsinyilee theelectromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT shihkanglin electromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT yuchenliu electromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT shangjuichiu electromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT yentingliu electromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion AT hsinyilee electromigrationeffectrevisitednonuniformlocaltensilestressdrivendiffusion
_version_	1718384938288414720

The electromigration effect revisited: non-uniform local tensile stress-driven diffusion

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