The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
Abstract The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here,...
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Autores principales: | Shih-kang Lin, Yu-chen Liu, Shang-Jui Chiu, Yen-Ting Liu, Hsin-Yi Lee |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2017
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Materias: | |
Acceso en línea: | https://doaj.org/article/e7e182a4b85c4c0994c957dfef0de697 |
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