The electromigration effect revisited: non-uniform local tensile stress-driven diffusion

Abstract The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here,...

Full description

Saved in:
Bibliographic Details
Main Authors: Shih-kang Lin, Yu-chen Liu, Shang-Jui Chiu, Yen-Ting Liu, Hsin-Yi Lee
Format: article
Language:EN
Published: Nature Portfolio 2017
Subjects:
R
Q
Online Access:https://doaj.org/article/e7e182a4b85c4c0994c957dfef0de697
Tags: Add Tag
No Tags, Be the first to tag this record!