Estimation of leaf area in sweet cherry using a non-destructive method
Leaf area measurement can be a time consuming process and requires sophisticated electronic instruments. The objective of this research was to develop a simple, accurate, non-destructive and time saving predictive model for leaf area (LA) estimation in sweet cherry trees. Linear regression equati...
Guardado en:
| Autores principales: | , |
|---|---|
| Formato: | article |
| Lenguaje: | EN ES |
| Publicado: |
Instituto Nacional de Tecnología Agropecuaria (INTA)
2006
|
| Materias: | |
| Acceso en línea: | https://doaj.org/article/eb0eb9d331814bb48d9aef1e54ec1d9e |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| id |
oai:doaj.org-article:eb0eb9d331814bb48d9aef1e54ec1d9e |
|---|---|
| record_format |
dspace |
| spelling |
oai:doaj.org-article:eb0eb9d331814bb48d9aef1e54ec1d9e2021-11-11T15:38:42ZEstimation of leaf area in sweet cherry using a non-destructive method0325-87181669-2314https://doaj.org/article/eb0eb9d331814bb48d9aef1e54ec1d9e2006-01-01T00:00:00Zhttp://www.redalyc.org/articulo.oa?id=86435110https://doaj.org/toc/0325-8718https://doaj.org/toc/1669-2314Leaf area measurement can be a time consuming process and requires sophisticated electronic instruments. The objective of this research was to develop a simple, accurate, non-destructive and time saving predictive model for leaf area (LA) estimation in sweet cherry trees. Linear regression equations were fitted and evaluated for three cultivars and two training systems using alternatively the length (L), the width (W) and their product (L*W) as independent variables. Regression using L*W variable fitted the data better (R2 = 0.994) than L or W (R2 = 0.863 and 0.787, respectively). The slopes using L*W as the explanatory variable were between 0.6776 and 0.6442 for different combinations of cultivar and training system. Combinations of cultivar training system showed different slopes (P<0.05), except for «tatura-Bing» and «vase-Lapins». A general equation had a slope of 0.6612 with R2 = 0.993 (slightly lower than considering all combinations of cultivar and training system). Validation of the general equation using extra data from a «Lapins/ Mahaleb» orchard showed high accuracy (R2 = 0.9826), but underestimated LA. However, the general equation can be used for predicting LA for practical purposes, such as estimating Leaf Area Index of commercial orchards.E.D. CittadiniP.L. PeriInstituto Nacional de Tecnología Agropecuaria (INTA)articleleaf areaprunus aviumnondestructive estimationleaf lengthleaf widthAgricultureSAgriculture (General)S1-972ENESRIA: Revista Investigaciones Agropecuarias, Vol 35, Iss 1, Pp 143-150 (2006) |
| institution |
DOAJ |
| collection |
DOAJ |
| language |
EN ES |
| topic |
leaf area prunus avium non destructive estimation leaf length leaf width Agriculture S Agriculture (General) S1-972 |
| spellingShingle |
leaf area prunus avium non destructive estimation leaf length leaf width Agriculture S Agriculture (General) S1-972 E.D. Cittadini P.L. Peri Estimation of leaf area in sweet cherry using a non-destructive method |
| description |
Leaf area measurement can be a time consuming process and requires
sophisticated electronic instruments. The objective of this research was to develop
a simple, accurate, non-destructive and time saving predictive model for leaf area
(LA) estimation in sweet cherry trees. Linear regression equations were fitted and
evaluated for three cultivars and two training systems using alternatively the length
(L), the width (W) and their product (L*W) as independent variables. Regression
using L*W variable fitted the data better (R2 = 0.994) than L or W (R2 = 0.863 and
0.787, respectively). The slopes using L*W as the explanatory variable were between
0.6776 and 0.6442 for different combinations of cultivar and training system.
Combinations of cultivar training system showed different slopes (P<0.05), except
for «tatura-Bing» and «vase-Lapins». A general equation had a slope of 0.6612 with
R2 = 0.993 (slightly lower than considering all combinations of cultivar and training
system). Validation of the general equation using extra data from a «Lapins/
Mahaleb» orchard showed high accuracy (R2 = 0.9826), but underestimated LA.
However, the general equation can be used for predicting LA for practical purposes,
such as estimating Leaf Area Index of commercial orchards. |
| format |
article |
| author |
E.D. Cittadini P.L. Peri |
| author_facet |
E.D. Cittadini P.L. Peri |
| author_sort |
E.D. Cittadini |
| title |
Estimation of leaf area in sweet
cherry using a non-destructive
method |
| title_short |
Estimation of leaf area in sweet
cherry using a non-destructive
method |
| title_full |
Estimation of leaf area in sweet
cherry using a non-destructive
method |
| title_fullStr |
Estimation of leaf area in sweet
cherry using a non-destructive
method |
| title_full_unstemmed |
Estimation of leaf area in sweet
cherry using a non-destructive
method |
| title_sort |
estimation of leaf area in sweet
cherry using a non-destructive
method |
| publisher |
Instituto Nacional de Tecnología Agropecuaria (INTA) |
| publishDate |
2006 |
| url |
https://doaj.org/article/eb0eb9d331814bb48d9aef1e54ec1d9e |
| work_keys_str_mv |
AT edcittadini estimationofleafareainsweetcherryusinganondestructivemethod AT plperi estimationofleafareainsweetcherryusinganondestructivemethod |
| _version_ |
1718434768940433408 |