The effect of pupil transmittance on axial resolution of reflection phase microscopy
Abstract A reflection phase microscope (RPM) can be equipped with the capability of depth selection by employing a gating mechanism. However, it is difficult to achieve an axial resolution close to the diffraction limit in real implementation. Here, we systematically investigated the uneven interfer...
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Nature Portfolio
2021
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oai:doaj.org-article:eb2e38b36b9f49039764e055bb71174e2021-11-28T12:19:59ZThe effect of pupil transmittance on axial resolution of reflection phase microscopy10.1038/s41598-021-02188-02045-2322https://doaj.org/article/eb2e38b36b9f49039764e055bb71174e2021-11-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-02188-0https://doaj.org/toc/2045-2322Abstract A reflection phase microscope (RPM) can be equipped with the capability of depth selection by employing a gating mechanism. However, it is difficult to achieve an axial resolution close to the diffraction limit in real implementation. Here, we systematically investigated the uneven interference contrast produced by pupil transmittance of the objective lens and found that it was the main cause of the practical limit that prevents the axial resolution from reaching its diffraction limit. Then we modulated the power of illumination light to obtain a uniform interference contrast over the entire pupil. Consequently, we could achieve an axial resolution fairly close to the diffraction limit set by the experimental conditions.Min Gyu HyeonKwanjun ParkTaeseok Daniel YangTaedong KongBeop-Min KimYoungwoon ChoiNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-9 (2021) |
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Medicine R Science Q Min Gyu Hyeon Kwanjun Park Taeseok Daniel Yang Taedong Kong Beop-Min Kim Youngwoon Choi The effect of pupil transmittance on axial resolution of reflection phase microscopy |
description |
Abstract A reflection phase microscope (RPM) can be equipped with the capability of depth selection by employing a gating mechanism. However, it is difficult to achieve an axial resolution close to the diffraction limit in real implementation. Here, we systematically investigated the uneven interference contrast produced by pupil transmittance of the objective lens and found that it was the main cause of the practical limit that prevents the axial resolution from reaching its diffraction limit. Then we modulated the power of illumination light to obtain a uniform interference contrast over the entire pupil. Consequently, we could achieve an axial resolution fairly close to the diffraction limit set by the experimental conditions. |
format |
article |
author |
Min Gyu Hyeon Kwanjun Park Taeseok Daniel Yang Taedong Kong Beop-Min Kim Youngwoon Choi |
author_facet |
Min Gyu Hyeon Kwanjun Park Taeseok Daniel Yang Taedong Kong Beop-Min Kim Youngwoon Choi |
author_sort |
Min Gyu Hyeon |
title |
The effect of pupil transmittance on axial resolution of reflection phase microscopy |
title_short |
The effect of pupil transmittance on axial resolution of reflection phase microscopy |
title_full |
The effect of pupil transmittance on axial resolution of reflection phase microscopy |
title_fullStr |
The effect of pupil transmittance on axial resolution of reflection phase microscopy |
title_full_unstemmed |
The effect of pupil transmittance on axial resolution of reflection phase microscopy |
title_sort |
effect of pupil transmittance on axial resolution of reflection phase microscopy |
publisher |
Nature Portfolio |
publishDate |
2021 |
url |
https://doaj.org/article/eb2e38b36b9f49039764e055bb71174e |
work_keys_str_mv |
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1718408052472807424 |