Cita APA (7a ed.)

Honggang, Y., Zhicheng, S., Fei, T., Yitian, B., Xiangzhou, L., Guangde, C., . . . Shijie, X. (2018). Probing defects in ZnO by persistent phosphorescence. Institue of Optics and Electronics, Chinese Academy of Sciences.

Cita Chicago Style (17a ed.)

Honggang, Ye, Su Zhicheng, Tang Fei, Bao Yitian, Lao Xiangzhou, Chen Guangde, Wang Jian, y Xu Shijie. Probing Defects in ZnO by Persistent Phosphorescence. Institue of Optics and Electronics, Chinese Academy of Sciences, 2018.

Cita MLA (8a ed.)

Honggang, Ye, et al. Probing Defects in ZnO by Persistent Phosphorescence. Institue of Optics and Electronics, Chinese Academy of Sciences, 2018.