Modulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys

Abstract The present work displays a route to design strain gradients at the interface between substrate and van der Waals bonded materials. The latter are expected to grow decoupled from the substrates and fully relaxed and thus, by definition, incompatible with conventional strain engineering. By...

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Autores principales: Eugenio Zallo, Stefano Cecchi, Jos E. Boschker, Antonio M. Mio, Fabrizio Arciprete, Stefania Privitera, Raffaella Calarco
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Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/ee90e62a5b6047f7a2f0e1159e2bdfdc
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spelling oai:doaj.org-article:ee90e62a5b6047f7a2f0e1159e2bdfdc2021-12-02T16:07:04ZModulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys10.1038/s41598-017-01502-z2045-2322https://doaj.org/article/ee90e62a5b6047f7a2f0e1159e2bdfdc2017-05-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-01502-zhttps://doaj.org/toc/2045-2322Abstract The present work displays a route to design strain gradients at the interface between substrate and van der Waals bonded materials. The latter are expected to grow decoupled from the substrates and fully relaxed and thus, by definition, incompatible with conventional strain engineering. By the usage of passivated vicinal surfaces we are able to insert strain at step edges of layered chalcogenides, as demonstrated by the tilt of the epilayer in the growth direction with respect of the substrate orientation. The interplay between classical and van der Waals epitaxy can be modulated with an accurate choice of the substrate miscut. High quality crystalline GexSb2Te3+x with almost Ge1Sb2Te4 composition and improved degree of ordering of the vacancy layers is thus obtained by epitaxial growth of layers on 3–4° stepped Si substrates. These results highlight that it is possible to build and control strain in van der Waals systems, therefore opening up new prospects for the functionalization of epilayers by directly employing vicinal substrates.Eugenio ZalloStefano CecchiJos E. BoschkerAntonio M. MioFabrizio ArcipreteStefania PriviteraRaffaella CalarcoNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-7 (2017)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Eugenio Zallo
Stefano Cecchi
Jos E. Boschker
Antonio M. Mio
Fabrizio Arciprete
Stefania Privitera
Raffaella Calarco
Modulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys
description Abstract The present work displays a route to design strain gradients at the interface between substrate and van der Waals bonded materials. The latter are expected to grow decoupled from the substrates and fully relaxed and thus, by definition, incompatible with conventional strain engineering. By the usage of passivated vicinal surfaces we are able to insert strain at step edges of layered chalcogenides, as demonstrated by the tilt of the epilayer in the growth direction with respect of the substrate orientation. The interplay between classical and van der Waals epitaxy can be modulated with an accurate choice of the substrate miscut. High quality crystalline GexSb2Te3+x with almost Ge1Sb2Te4 composition and improved degree of ordering of the vacancy layers is thus obtained by epitaxial growth of layers on 3–4° stepped Si substrates. These results highlight that it is possible to build and control strain in van der Waals systems, therefore opening up new prospects for the functionalization of epilayers by directly employing vicinal substrates.
format article
author Eugenio Zallo
Stefano Cecchi
Jos E. Boschker
Antonio M. Mio
Fabrizio Arciprete
Stefania Privitera
Raffaella Calarco
author_facet Eugenio Zallo
Stefano Cecchi
Jos E. Boschker
Antonio M. Mio
Fabrizio Arciprete
Stefania Privitera
Raffaella Calarco
author_sort Eugenio Zallo
title Modulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys
title_short Modulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys
title_full Modulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys
title_fullStr Modulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys
title_full_unstemmed Modulation of van der Waals and classical epitaxy induced by strain at the Si step edges in GeSbTe alloys
title_sort modulation of van der waals and classical epitaxy induced by strain at the si step edges in gesbte alloys
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/ee90e62a5b6047f7a2f0e1159e2bdfdc
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