Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass

Abstract Recently, liquid phase crystallization of thin silicon films has emerged as a candidate for thin-film photovoltaics. On 10 μm thin absorbers, wafer-equivalent morphologies and open-circuit voltages were reached, leading to 13.2% record efficiency. However, short-circuit current densities ar...

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Autores principales:	David Eisenhauer, Grit Köppel, Klaus Jäger, Duote Chen, Oleksandra Shargaieva, Paul Sonntag, Daniel Amkreutz, Bernd Rech, Christiane Becker
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/efab301c9c1d4f6fa031ccb54b61a484
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spelling	oai:doaj.org-article:efab301c9c1d4f6fa031ccb54b61a4842021-12-02T12:30:52ZSmooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass10.1038/s41598-017-02874-y2045-2322https://doaj.org/article/efab301c9c1d4f6fa031ccb54b61a4842017-06-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-02874-yhttps://doaj.org/toc/2045-2322Abstract Recently, liquid phase crystallization of thin silicon films has emerged as a candidate for thin-film photovoltaics. On 10 μm thin absorbers, wafer-equivalent morphologies and open-circuit voltages were reached, leading to 13.2% record efficiency. However, short-circuit current densities are still limited, mainly due to optical losses at the glass-silicon interface. While nano-structures at this interface have been shown to efficiently reduce reflection, up to now these textures caused a deterioration of electronic silicon material quality. Therefore, optical gains were mitigated due to recombination losses. Here, the SMooth Anti-Reflective Three-dimensional (SMART) texture is introduced to overcome this trade-off. By smoothing nanoimprinted SiO x nano-pillar arrays with spin-coated TiO x layers, light in-coupling into laser-crystallized silicon solar cells is significantly improved as successfully demonstrated in three-dimensional simulations and in experiment. At the same time, electronic silicon material quality is equivalent to that of planar references, allowing to reach V oc values above 630 mV. Furthermore, the short-circuit current density could be increased from 21.0 mA cm−2 for planar reference cells to 24.5 mA cm−2 on SMART textures, a relative increase of 18%. External quantum efficiency measurements yield an increase for wavelengths up to 700 nm compared to a state-of-the-art solar cell with 11.9% efficiency, corresponding to a j sc, EQE gain of 2.8 mA cm−2.David EisenhauerGrit KöppelKlaus JägerDuote ChenOleksandra ShargaievaPaul SonntagDaniel AmkreutzBernd RechChristiane BeckerNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-10 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q David Eisenhauer Grit Köppel Klaus Jäger Duote Chen Oleksandra Shargaieva Paul Sonntag Daniel Amkreutz Bernd Rech Christiane Becker Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass
description	Abstract Recently, liquid phase crystallization of thin silicon films has emerged as a candidate for thin-film photovoltaics. On 10 μm thin absorbers, wafer-equivalent morphologies and open-circuit voltages were reached, leading to 13.2% record efficiency. However, short-circuit current densities are still limited, mainly due to optical losses at the glass-silicon interface. While nano-structures at this interface have been shown to efficiently reduce reflection, up to now these textures caused a deterioration of electronic silicon material quality. Therefore, optical gains were mitigated due to recombination losses. Here, the SMooth Anti-Reflective Three-dimensional (SMART) texture is introduced to overcome this trade-off. By smoothing nanoimprinted SiO x nano-pillar arrays with spin-coated TiO x layers, light in-coupling into laser-crystallized silicon solar cells is significantly improved as successfully demonstrated in three-dimensional simulations and in experiment. At the same time, electronic silicon material quality is equivalent to that of planar references, allowing to reach V oc values above 630 mV. Furthermore, the short-circuit current density could be increased from 21.0 mA cm−2 for planar reference cells to 24.5 mA cm−2 on SMART textures, a relative increase of 18%. External quantum efficiency measurements yield an increase for wavelengths up to 700 nm compared to a state-of-the-art solar cell with 11.9% efficiency, corresponding to a j sc, EQE gain of 2.8 mA cm−2.
format	article
author	David Eisenhauer Grit Köppel Klaus Jäger Duote Chen Oleksandra Shargaieva Paul Sonntag Daniel Amkreutz Bernd Rech Christiane Becker
author_facet	David Eisenhauer Grit Köppel Klaus Jäger Duote Chen Oleksandra Shargaieva Paul Sonntag Daniel Amkreutz Bernd Rech Christiane Becker
author_sort	David Eisenhauer
title	Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass
title_short	Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass
title_full	Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass
title_fullStr	Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass
title_full_unstemmed	Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass
title_sort	smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/efab301c9c1d4f6fa031ccb54b61a484
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Smooth anti-reflective three-dimensional textures for liquid phase crystallized silicon thin-film solar cells on glass

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