Electrical resistance of individual defects at a topological insulator surface
Exploiting topological insulator surface states in electronic devices requires an understanding of the factors that affect transport. Here, the authors use scanning tunnelling potentiometry to determine the contributions of different kinds of surface defects to the electrical resistance.
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| Autores principales: | , , , , , , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2017
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/efe40fa904f147b3a819951b62fb0883 |
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