All-inorganic perovskite quantum dot light-emitting memories

Electric field induced ion migration is a well-known phenomenon in perovskite, but the consequences are notorious, and thus needs to be prevented. Here, on the other hand, the authors cleverly manipulate this event for realising resistive random-access memory and light-emitting electrochemical cell...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Meng-Cheng Yen, Chia-Jung Lee, Kang-Hsiang Liu, Yi Peng, Junfu Leng, Tzu-Hsuan Chang, Chun-Chieh Chang, Kaoru Tamada, Ya-Ju Lee
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
Materias:
Q
Acceso en línea:https://doaj.org/article/f1155131f73a4d929c2706f0c0f8bae3
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares