Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media

Abstract X-ray computed micro-tomography typically involves a trade-off between sample size and resolution, complicating the study at a micrometer scale of representative volumes of materials with broad feature size distributions (e.g. natural stones). X-ray dark-field tomography exploits scattering...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Benjamin K. Blykers, Caori Organista, Matthieu N. Boone, Matias Kagias, Federica Marone, Marco Stampanoni, Tom Bultreys, Veerle Cnudde, Jan Aelterman
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
Materias:
R
Q
Acceso en línea:https://doaj.org/article/f63e8cbd0e7d4d7a9019b6ff971d071d
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares