Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C
Abstract The high-temperature stability of thermal emitters is one of the critical properties of thermophotovoltaic (TPV) systems to obtain high radiative power and conversion efficiencies. W and HfO2 are ideal due to their high melting points and low vapor pressures. At high temperatures and given...
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2021
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oai:doaj.org-article:f68b42314a7c4beb906fa0046e9536802021-12-02T12:09:18ZStructural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C10.1038/s41598-021-82821-02045-2322https://doaj.org/article/f68b42314a7c4beb906fa0046e9536802021-02-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-82821-0https://doaj.org/toc/2045-2322Abstract The high-temperature stability of thermal emitters is one of the critical properties of thermophotovoltaic (TPV) systems to obtain high radiative power and conversion efficiencies. W and HfO2 are ideal due to their high melting points and low vapor pressures. At high temperatures and given vacuum conditions, W is prone to oxidation resulting in instantaneous sublimation of volatile W oxides. Herein, we present a detailed in-situ XRD analysis of the morphological changes of a 3-layer-system: HfO2/W/HfO2 layers, in a high-temperature environment, up to 1520 °C. These samples were annealed between 300 °C and 1520 °C for 6 h, 20 h, and 40 h at a vacuum pressure below 3 × 10–6 mbar using an in-situ high-temperature X-ray diffractometer, which allows investigation of crucial alterations in HfO2 and W layers. HfO2 exhibits polymorphic behavior, phase transformations and anisotropy of thermal expansion leads to formation of voids above 800 °C. These voids serve as transport channels for the residual O2 present in the annealing chamber to access W, react with it and form volatile tungsten oxides. An activation energy of 1.2 eV is calculated. This study clarifies the limits for the operation of W-HfO2 spectrally selective emitters for TPV in high-temperature applications.Gnanavel Vaidhyanathan KrishnamurthyManohar ChirumamillaSurya Snata RoutKaline P. FurlanTobias KrekelerMartin RitterHans-Werner BeckerAlexander Yu PetrovManfred EichMichael StörmerNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-12 (2021) |
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Medicine R Science Q |
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Medicine R Science Q Gnanavel Vaidhyanathan Krishnamurthy Manohar Chirumamilla Surya Snata Rout Kaline P. Furlan Tobias Krekeler Martin Ritter Hans-Werner Becker Alexander Yu Petrov Manfred Eich Michael Störmer Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C |
| description |
Abstract The high-temperature stability of thermal emitters is one of the critical properties of thermophotovoltaic (TPV) systems to obtain high radiative power and conversion efficiencies. W and HfO2 are ideal due to their high melting points and low vapor pressures. At high temperatures and given vacuum conditions, W is prone to oxidation resulting in instantaneous sublimation of volatile W oxides. Herein, we present a detailed in-situ XRD analysis of the morphological changes of a 3-layer-system: HfO2/W/HfO2 layers, in a high-temperature environment, up to 1520 °C. These samples were annealed between 300 °C and 1520 °C for 6 h, 20 h, and 40 h at a vacuum pressure below 3 × 10–6 mbar using an in-situ high-temperature X-ray diffractometer, which allows investigation of crucial alterations in HfO2 and W layers. HfO2 exhibits polymorphic behavior, phase transformations and anisotropy of thermal expansion leads to formation of voids above 800 °C. These voids serve as transport channels for the residual O2 present in the annealing chamber to access W, react with it and form volatile tungsten oxides. An activation energy of 1.2 eV is calculated. This study clarifies the limits for the operation of W-HfO2 spectrally selective emitters for TPV in high-temperature applications. |
| format |
article |
| author |
Gnanavel Vaidhyanathan Krishnamurthy Manohar Chirumamilla Surya Snata Rout Kaline P. Furlan Tobias Krekeler Martin Ritter Hans-Werner Becker Alexander Yu Petrov Manfred Eich Michael Störmer |
| author_facet |
Gnanavel Vaidhyanathan Krishnamurthy Manohar Chirumamilla Surya Snata Rout Kaline P. Furlan Tobias Krekeler Martin Ritter Hans-Werner Becker Alexander Yu Petrov Manfred Eich Michael Störmer |
| author_sort |
Gnanavel Vaidhyanathan Krishnamurthy |
| title |
Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C |
| title_short |
Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C |
| title_full |
Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C |
| title_fullStr |
Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C |
| title_full_unstemmed |
Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C |
| title_sort |
structural degradation of tungsten sandwiched in hafnia layers determined by in-situ xrd up to 1520 °c |
| publisher |
Nature Portfolio |
| publishDate |
2021 |
| url |
https://doaj.org/article/f68b42314a7c4beb906fa0046e953680 |
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