Integrated Optical Addressing of a Trapped Ytterbium Ion

We report on the characterization of heating rates and photoinduced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturabil...

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Autores principales:	M. Ivory, W. J. Setzer, N. Karl, H. McGuinness, C. DeRose, M. Blain, D. Stick, M. Gehl, L. P. Parazzoli
Formato:	article
Lenguaje:	EN
Publicado:	American Physical Society 2021
Materias:	Physics QC1-999
Acceso en línea:	https://doaj.org/article/f68c79edfc2c4b339758f73abab266b3
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id	oai:doaj.org-article:f68c79edfc2c4b339758f73abab266b3
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spelling	oai:doaj.org-article:f68c79edfc2c4b339758f73abab266b32021-11-16T16:26:49ZIntegrated Optical Addressing of a Trapped Ytterbium Ion10.1103/PhysRevX.11.0410332160-3308https://doaj.org/article/f68c79edfc2c4b339758f73abab266b32021-11-01T00:00:00Zhttp://doi.org/10.1103/PhysRevX.11.041033http://doi.org/10.1103/PhysRevX.11.041033https://doaj.org/toc/2160-3308We report on the characterization of heating rates and photoinduced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here, we characterize the delivery of 435-nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of 0.78±0.05 q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz.M. IvoryW. J. SetzerN. KarlH. McGuinnessC. DeRoseM. BlainD. StickM. GehlL. P. ParazzoliAmerican Physical SocietyarticlePhysicsQC1-999ENPhysical Review X, Vol 11, Iss 4, p 041033 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Physics QC1-999
spellingShingle	Physics QC1-999 M. Ivory W. J. Setzer N. Karl H. McGuinness C. DeRose M. Blain D. Stick M. Gehl L. P. Parazzoli Integrated Optical Addressing of a Trapped Ytterbium Ion
description	We report on the characterization of heating rates and photoinduced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here, we characterize the delivery of 435-nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of 0.78±0.05 q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz.
format	article
author	M. Ivory W. J. Setzer N. Karl H. McGuinness C. DeRose M. Blain D. Stick M. Gehl L. P. Parazzoli
author_facet	M. Ivory W. J. Setzer N. Karl H. McGuinness C. DeRose M. Blain D. Stick M. Gehl L. P. Parazzoli
author_sort	M. Ivory
title	Integrated Optical Addressing of a Trapped Ytterbium Ion
title_short	Integrated Optical Addressing of a Trapped Ytterbium Ion
title_full	Integrated Optical Addressing of a Trapped Ytterbium Ion
title_fullStr	Integrated Optical Addressing of a Trapped Ytterbium Ion
title_full_unstemmed	Integrated Optical Addressing of a Trapped Ytterbium Ion
title_sort	integrated optical addressing of a trapped ytterbium ion
publisher	American Physical Society
publishDate	2021
url	https://doaj.org/article/f68c79edfc2c4b339758f73abab266b3
work_keys_str_mv	AT mivory integratedopticaladdressingofatrappedytterbiumion AT wjsetzer integratedopticaladdressingofatrappedytterbiumion AT nkarl integratedopticaladdressingofatrappedytterbiumion AT hmcguinness integratedopticaladdressingofatrappedytterbiumion AT cderose integratedopticaladdressingofatrappedytterbiumion AT mblain integratedopticaladdressingofatrappedytterbiumion AT dstick integratedopticaladdressingofatrappedytterbiumion AT mgehl integratedopticaladdressingofatrappedytterbiumion AT lpparazzoli integratedopticaladdressingofatrappedytterbiumion
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Integrated Optical Addressing of a Trapped Ytterbium Ion

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