Direct electric field imaging of graphene defects

Imaging chemical bonding states in defective graphene is important to determine its functional properties. Here, the authors report triangular and rectangular atomic electric fields in monolayer graphene induced by silicon as imaged by differential phase contrast STEM.

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Autores principales:	Ryo Ishikawa, Scott D. Findlay, Takehito Seki, Gabriel Sánchez-Santolino, Yuji Kohno, Yuichi Ikuhara, Naoya Shibata
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2018
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/f7177fd1daff4f009a1f73873ee73ea0
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spelling	oai:doaj.org-article:f7177fd1daff4f009a1f73873ee73ea02021-12-02T14:39:44ZDirect electric field imaging of graphene defects10.1038/s41467-018-06387-82041-1723https://doaj.org/article/f7177fd1daff4f009a1f73873ee73ea02018-09-01T00:00:00Zhttps://doi.org/10.1038/s41467-018-06387-8https://doaj.org/toc/2041-1723Imaging chemical bonding states in defective graphene is important to determine its functional properties. Here, the authors report triangular and rectangular atomic electric fields in monolayer graphene induced by silicon as imaged by differential phase contrast STEM.Ryo IshikawaScott D. FindlayTakehito SekiGabriel Sánchez-SantolinoYuji KohnoYuichi IkuharaNaoya ShibataNature PortfolioarticleScienceQENNature Communications, Vol 9, Iss 1, Pp 1-6 (2018)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Ryo Ishikawa Scott D. Findlay Takehito Seki Gabriel Sánchez-Santolino Yuji Kohno Yuichi Ikuhara Naoya Shibata Direct electric field imaging of graphene defects
description	Imaging chemical bonding states in defective graphene is important to determine its functional properties. Here, the authors report triangular and rectangular atomic electric fields in monolayer graphene induced by silicon as imaged by differential phase contrast STEM.
format	article
author	Ryo Ishikawa Scott D. Findlay Takehito Seki Gabriel Sánchez-Santolino Yuji Kohno Yuichi Ikuhara Naoya Shibata
author_facet	Ryo Ishikawa Scott D. Findlay Takehito Seki Gabriel Sánchez-Santolino Yuji Kohno Yuichi Ikuhara Naoya Shibata
author_sort	Ryo Ishikawa
title	Direct electric field imaging of graphene defects
title_short	Direct electric field imaging of graphene defects
title_full	Direct electric field imaging of graphene defects
title_fullStr	Direct electric field imaging of graphene defects
title_full_unstemmed	Direct electric field imaging of graphene defects
title_sort	direct electric field imaging of graphene defects
publisher	Nature Portfolio
publishDate	2018
url	https://doaj.org/article/f7177fd1daff4f009a1f73873ee73ea0
work_keys_str_mv	AT ryoishikawa directelectricfieldimagingofgraphenedefects AT scottdfindlay directelectricfieldimagingofgraphenedefects AT takehitoseki directelectricfieldimagingofgraphenedefects AT gabrielsanchezsantolino directelectricfieldimagingofgraphenedefects AT yujikohno directelectricfieldimagingofgraphenedefects AT yuichiikuhara directelectricfieldimagingofgraphenedefects AT naoyashibata directelectricfieldimagingofgraphenedefects
_version_	1718390571194646528

Direct electric field imaging of graphene defects

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