Cita APA (7a ed.)

Jin, Z., Shen, Y., Zuo, Y., Chan, Y. C., Mannan, S. H., & Nishikawa, H. (2021). Observation of void formation patterns in SnAg films undergoing electromigration and simulation using random walk methods. Nature Portfolio.

Cita Chicago Style (17a ed.)

Jin, Zhi, Yu-An Shen, Yang Zuo, Y. C. Chan, S. H. Mannan, y Hiroshi Nishikawa. Observation of Void Formation Patterns in SnAg Films Undergoing Electromigration and Simulation Using Random Walk Methods. Nature Portfolio, 2021.

Cita MLA (8a ed.)

Jin, Zhi, et al. Observation of Void Formation Patterns in SnAg Films Undergoing Electromigration and Simulation Using Random Walk Methods. Nature Portfolio, 2021.