APA (7th ed.) Citation

Jin, Z., Shen, Y., Zuo, Y., Chan, Y. C., Mannan, S. H., & Nishikawa, H. (2021). Observation of void formation patterns in SnAg films undergoing electromigration and simulation using random walk methods. Nature Portfolio.

Chicago Style (17th ed.) Citation

Jin, Zhi, Yu-An Shen, Yang Zuo, Y. C. Chan, S. H. Mannan, and Hiroshi Nishikawa. Observation of Void Formation Patterns in SnAg Films Undergoing Electromigration and Simulation Using Random Walk Methods. Nature Portfolio, 2021.

MLA (8th ed.) Citation

Jin, Zhi, et al. Observation of Void Formation Patterns in SnAg Films Undergoing Electromigration and Simulation Using Random Walk Methods. Nature Portfolio, 2021.