Style de citation APA (7e éd.)

Jin, Z., Shen, Y., Zuo, Y., Chan, Y. C., Mannan, S. H., & Nishikawa, H. (2021). Observation of void formation patterns in SnAg films undergoing electromigration and simulation using random walk methods. Nature Portfolio.

Style de citation Chicago (17e éd.)

Jin, Zhi, Yu-An Shen, Yang Zuo, Y. C. Chan, S. H. Mannan, et Hiroshi Nishikawa. Observation of Void Formation Patterns in SnAg Films Undergoing Electromigration and Simulation Using Random Walk Methods. Nature Portfolio, 2021.

Style de citation MLA (8e éd.)

Jin, Zhi, et al. Observation of Void Formation Patterns in SnAg Films Undergoing Electromigration and Simulation Using Random Walk Methods. Nature Portfolio, 2021.