Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was applied to detect traces of amphetamine on fingerprints. In the present study, three different lift tapes and latent powder fingerprints were tested. The obtained results show that it is possible to identify traces of a drug as well as it...

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Autores principales:	Małgorzata I. Szynkowska-Jóźwik, Elżbieta Maćkiewicz, Jacek Rogowski, Magdalena Gajek, Aleksandra Pawlaczyk, Marcel de Puit, Andrzej Parczewski
Formato:	article
Lenguaje:	EN
Publicado:	MDPI AG 2021
Materias:	fingerprint TOF-SIMS amphetamine visualisation lifting tape black powder Technology T Electrical engineering. Electronics. Nuclear engineering TK1-9971 Engineering (General). Civil engineering (General) TA1-2040 Microscopy QH201-278.5 Descriptive and experimental mechanics QC120-168.85
Acceso en línea:	https://doaj.org/article/f8b3f8eeb30f4e3e9f74b42b3a3ebde0
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spelling	oai:doaj.org-article:f8b3f8eeb30f4e3e9f74b42b3a3ebde02021-11-11T17:49:48ZVisualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique10.3390/ma142162431996-1944https://doaj.org/article/f8b3f8eeb30f4e3e9f74b42b3a3ebde02021-10-01T00:00:00Zhttps://www.mdpi.com/1996-1944/14/21/6243https://doaj.org/toc/1996-1944Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was applied to detect traces of amphetamine on fingerprints. In the present study, three different lift tapes and latent powder fingerprints were tested. The obtained results show that it is possible to identify traces of a drug as well as its distribution over the tested fingerprint after its transfer from the primary base onto an adhesive lifter (secondary base). Moreover, images obtained by the TOF-SIMS technique enable the observation of very small areas of the analysed fingerprint as well as the identification of micro-objects (residues of a contaminant) that were left on the fingerprint. The use of the black latent fingerprint powder did not interfere with the TOF-SIMS analysis, which makes it possible to effectively use this technique to study the traces of substances on the revealed fingerprints.Małgorzata I. Szynkowska-JóźwikElżbieta MaćkiewiczJacek RogowskiMagdalena GajekAleksandra PawlaczykMarcel de PuitAndrzej ParczewskiMDPI AGarticlefingerprintTOF-SIMSamphetamine visualisationlifting tapeblack powderTechnologyTElectrical engineering. Electronics. Nuclear engineeringTK1-9971Engineering (General). Civil engineering (General)TA1-2040MicroscopyQH201-278.5Descriptive and experimental mechanicsQC120-168.85ENMaterials, Vol 14, Iss 6243, p 6243 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	fingerprint TOF-SIMS amphetamine visualisation lifting tape black powder Technology T Electrical engineering. Electronics. Nuclear engineering TK1-9971 Engineering (General). Civil engineering (General) TA1-2040 Microscopy QH201-278.5 Descriptive and experimental mechanics QC120-168.85
spellingShingle	fingerprint TOF-SIMS amphetamine visualisation lifting tape black powder Technology T Electrical engineering. Electronics. Nuclear engineering TK1-9971 Engineering (General). Civil engineering (General) TA1-2040 Microscopy QH201-278.5 Descriptive and experimental mechanics QC120-168.85 Małgorzata I. Szynkowska-Jóźwik Elżbieta Maćkiewicz Jacek Rogowski Magdalena Gajek Aleksandra Pawlaczyk Marcel de Puit Andrzej Parczewski Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique
description	Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was applied to detect traces of amphetamine on fingerprints. In the present study, three different lift tapes and latent powder fingerprints were tested. The obtained results show that it is possible to identify traces of a drug as well as its distribution over the tested fingerprint after its transfer from the primary base onto an adhesive lifter (secondary base). Moreover, images obtained by the TOF-SIMS technique enable the observation of very small areas of the analysed fingerprint as well as the identification of micro-objects (residues of a contaminant) that were left on the fingerprint. The use of the black latent fingerprint powder did not interfere with the TOF-SIMS analysis, which makes it possible to effectively use this technique to study the traces of substances on the revealed fingerprints.
format	article
author	Małgorzata I. Szynkowska-Jóźwik Elżbieta Maćkiewicz Jacek Rogowski Magdalena Gajek Aleksandra Pawlaczyk Marcel de Puit Andrzej Parczewski
author_facet	Małgorzata I. Szynkowska-Jóźwik Elżbieta Maćkiewicz Jacek Rogowski Magdalena Gajek Aleksandra Pawlaczyk Marcel de Puit Andrzej Parczewski
author_sort	Małgorzata I. Szynkowska-Jóźwik
title	Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique
title_short	Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique
title_full	Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique
title_fullStr	Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique
title_full_unstemmed	Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique
title_sort	visualisation of amphetamine contamination in fingerprints using tof-sims technique
publisher	MDPI AG
publishDate	2021
url	https://doaj.org/article/f8b3f8eeb30f4e3e9f74b42b3a3ebde0
work_keys_str_mv	AT małgorzataiszynkowskajozwik visualisationofamphetaminecontaminationinfingerprintsusingtofsimstechnique AT elzbietamackiewicz visualisationofamphetaminecontaminationinfingerprintsusingtofsimstechnique AT jacekrogowski visualisationofamphetaminecontaminationinfingerprintsusingtofsimstechnique AT magdalenagajek visualisationofamphetaminecontaminationinfingerprintsusingtofsimstechnique AT aleksandrapawlaczyk visualisationofamphetaminecontaminationinfingerprintsusingtofsimstechnique AT marceldepuit visualisationofamphetaminecontaminationinfingerprintsusingtofsimstechnique AT andrzejparczewski visualisationofamphetaminecontaminationinfingerprintsusingtofsimstechnique
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Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique

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