Thermoelectric power of Tl-doped PbTe monocrystal

Results of the measurements of thermoelectric properties of thin monocrystal wires of Pb1-xTlxTe (x=0.001 ÷ 0.02, d = 5 ÷ 100 μm) in the temperature region 4,2 ÷ 300 K, which were obtained from solution melt by the filling of quartz capillary with the following crystallization of material...

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Auteur principal: Zasaviţchi, Efim
Format: article
Langue:EN
Publié: D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2005
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Accès en ligne:https://doaj.org/article/fcb04eec413d46b9a03fefaebd5d1533
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Résumé:Results of the measurements of thermoelectric properties of thin monocrystal wires of Pb1-xTlxTe (x=0.001 ÷ 0.02, d = 5 ÷ 100 μm) in the temperature region 4,2 ÷ 300 K, which were obtained from solution melt by the filling of quartz capillary with the following crystallization of material are presented. For the samples corresponding to chemical composition with concentration of thallium 0,0025