Scalable long read self-correction and assembly polishing with multiple sequence alignment
Abstract Third-generation sequencing technologies allow to sequence long reads of tens of kbp, that are expected to solve various problems. However, they display high error rates, currently capped around 10%. Self-correction is thus regularly used in long reads analysis projects. We introduce CONSEN...
Guardado en:
Autores principales: | Pierre Morisse, Camille Marchet, Antoine Limasset, Thierry Lecroq, Arnaud Lefebvre |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2021
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Materias: | |
Acceso en línea: | https://doaj.org/article/fcd66fffea6c4c26a56a20d13c28f227 |
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