Process robustness and defect formation mechanisms in unidirectional semipreg
Out-of-autoclave/vacuum-bag-only (OoA/VBO) composite processing has emerged as an alternative to autoclave cure, addressing economic, environmental, and production flexibility limitations associated with autoclave production. VBO processing can produce defect-free components under ideal processing c...
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Taylor & Francis Group
2020
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oai:doaj.org-article:fd661ccd6d72431eafd625fff761d50b2021-12-02T12:03:53ZProcess robustness and defect formation mechanisms in unidirectional semipreg2055-035910.1080/20550340.2020.1834789https://doaj.org/article/fd661ccd6d72431eafd625fff761d50b2020-10-01T00:00:00Zhttp://dx.doi.org/10.1080/20550340.2020.1834789https://doaj.org/toc/2055-0359Out-of-autoclave/vacuum-bag-only (OoA/VBO) composite processing has emerged as an alternative to autoclave cure, addressing economic, environmental, and production flexibility limitations associated with autoclave production. VBO processing can produce defect-free components under ideal processing conditions; however, adverse process conditions (e.g. poor vacuum) commonly encountered in manufacturing environments result in unacceptably high scrap rates, preventing more widespread adoption of such techniques. This work explores how modifications to prepreg format can increase process robustness. A unidirectional (UD) prepreg was produced with a customized, discontinuous resin distribution, henceforth referred to as semipreg. The semipreg exhibited through-thickness permeability orders of magnitude greater than conventional hot-melt VBO prepregs. The semipreg also was less sensitive to variations in process conditions than conventional VBO prepreg. In situ process monitoring allowed observation and identification of two defect formation mechanisms arising during cure of the custom prepreg. Resin feature topography played a critical role in these mechanisms, indicating its importance to the design of next generation VBO semipregs.William T. EdwardsPatricio MartinezSteven R. NuttTaylor & Francis Grouparticleprepregsemipregthrough-thickness permeabilityrobust manufacturingprepreg format designdefect formation mechanismPolymers and polymer manufactureTP1080-1185AutomationT59.5ENAdvanced Manufacturing: Polymer & Composites Science, Vol 6, Iss 4, Pp 198-211 (2020) |
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prepreg semipreg through-thickness permeability robust manufacturing prepreg format design defect formation mechanism Polymers and polymer manufacture TP1080-1185 Automation T59.5 |
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prepreg semipreg through-thickness permeability robust manufacturing prepreg format design defect formation mechanism Polymers and polymer manufacture TP1080-1185 Automation T59.5 William T. Edwards Patricio Martinez Steven R. Nutt Process robustness and defect formation mechanisms in unidirectional semipreg |
description |
Out-of-autoclave/vacuum-bag-only (OoA/VBO) composite processing has emerged as an alternative to autoclave cure, addressing economic, environmental, and production flexibility limitations associated with autoclave production. VBO processing can produce defect-free components under ideal processing conditions; however, adverse process conditions (e.g. poor vacuum) commonly encountered in manufacturing environments result in unacceptably high scrap rates, preventing more widespread adoption of such techniques. This work explores how modifications to prepreg format can increase process robustness. A unidirectional (UD) prepreg was produced with a customized, discontinuous resin distribution, henceforth referred to as semipreg. The semipreg exhibited through-thickness permeability orders of magnitude greater than conventional hot-melt VBO prepregs. The semipreg also was less sensitive to variations in process conditions than conventional VBO prepreg. In situ process monitoring allowed observation and identification of two defect formation mechanisms arising during cure of the custom prepreg. Resin feature topography played a critical role in these mechanisms, indicating its importance to the design of next generation VBO semipregs. |
format |
article |
author |
William T. Edwards Patricio Martinez Steven R. Nutt |
author_facet |
William T. Edwards Patricio Martinez Steven R. Nutt |
author_sort |
William T. Edwards |
title |
Process robustness and defect formation mechanisms in unidirectional semipreg |
title_short |
Process robustness and defect formation mechanisms in unidirectional semipreg |
title_full |
Process robustness and defect formation mechanisms in unidirectional semipreg |
title_fullStr |
Process robustness and defect formation mechanisms in unidirectional semipreg |
title_full_unstemmed |
Process robustness and defect formation mechanisms in unidirectional semipreg |
title_sort |
process robustness and defect formation mechanisms in unidirectional semipreg |
publisher |
Taylor & Francis Group |
publishDate |
2020 |
url |
https://doaj.org/article/fd661ccd6d72431eafd625fff761d50b |
work_keys_str_mv |
AT williamtedwards processrobustnessanddefectformationmechanismsinunidirectionalsemipreg AT patriciomartinez processrobustnessanddefectformationmechanismsinunidirectionalsemipreg AT stevenrnutt processrobustnessanddefectformationmechanismsinunidirectionalsemipreg |
_version_ |
1718394727962771456 |