A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser
Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kine...
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MDPI AG
2021
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oai:doaj.org-article:fe5b12ff1c794f5bbcd41838343fc26d2021-11-11T15:18:39ZA Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser10.3390/app1121102722076-3417https://doaj.org/article/fe5b12ff1c794f5bbcd41838343fc26d2021-11-01T00:00:00Zhttps://www.mdpi.com/2076-3417/11/21/10272https://doaj.org/toc/2076-3417Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kinetic energy to 1 keV. Here, we report on a recently built composite VMI spectrometer at the Shanghai soft X-ray free-electron laser, which can measure ion images and high-energy electron images simultaneously. In the SIMION simulation, we extended the electron kinetic energy to 1 keV with a resolution <2% while measuring the ions with the kinetic energy of 20 eV. The experimental performance is tested by measuring Ar 2p photoelectron spectra at Shanghai Synchrotron Radiation Facility, and <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mi mathvariant="normal">O</mi><mo>+</mo></msup></semantics></math></inline-formula> kinetic energy spectrum from dissociative ionization of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mi mathvariant="normal">O</mi><mn>2</mn></msub></semantics></math></inline-formula> by 800 nm femtosecond laser. We reached a resolution of 1.5% at the electron kinetic energy of 500 eV. When the electron arm is set for 100 eV, a resolution of 4% is reached at the ion kinetic energy of 5.6 eV. This composite VMI spectrometer will support the experiment, such as X-ray multi-photon excitation/ionization, Auger electrons emission, attosecond streaking.Bocheng DingWeiqing XuRuichang WuYunfei FengLifang TianXiaohong LiJianye HuangZhi LiuXiaojing LiuMDPI AGarticlevelocity map imagingSynchrotron Radiationfemtosecond laserfree-electron laserTechnologyTEngineering (General). Civil engineering (General)TA1-2040Biology (General)QH301-705.5PhysicsQC1-999ChemistryQD1-999ENApplied Sciences, Vol 11, Iss 10272, p 10272 (2021) |
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DOAJ |
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EN |
topic |
velocity map imaging Synchrotron Radiation femtosecond laser free-electron laser Technology T Engineering (General). Civil engineering (General) TA1-2040 Biology (General) QH301-705.5 Physics QC1-999 Chemistry QD1-999 |
spellingShingle |
velocity map imaging Synchrotron Radiation femtosecond laser free-electron laser Technology T Engineering (General). Civil engineering (General) TA1-2040 Biology (General) QH301-705.5 Physics QC1-999 Chemistry QD1-999 Bocheng Ding Weiqing Xu Ruichang Wu Yunfei Feng Lifang Tian Xiaohong Li Jianye Huang Zhi Liu Xiaojing Liu A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser |
description |
Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kinetic energy to 1 keV. Here, we report on a recently built composite VMI spectrometer at the Shanghai soft X-ray free-electron laser, which can measure ion images and high-energy electron images simultaneously. In the SIMION simulation, we extended the electron kinetic energy to 1 keV with a resolution <2% while measuring the ions with the kinetic energy of 20 eV. The experimental performance is tested by measuring Ar 2p photoelectron spectra at Shanghai Synchrotron Radiation Facility, and <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mi mathvariant="normal">O</mi><mo>+</mo></msup></semantics></math></inline-formula> kinetic energy spectrum from dissociative ionization of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mi mathvariant="normal">O</mi><mn>2</mn></msub></semantics></math></inline-formula> by 800 nm femtosecond laser. We reached a resolution of 1.5% at the electron kinetic energy of 500 eV. When the electron arm is set for 100 eV, a resolution of 4% is reached at the ion kinetic energy of 5.6 eV. This composite VMI spectrometer will support the experiment, such as X-ray multi-photon excitation/ionization, Auger electrons emission, attosecond streaking. |
format |
article |
author |
Bocheng Ding Weiqing Xu Ruichang Wu Yunfei Feng Lifang Tian Xiaohong Li Jianye Huang Zhi Liu Xiaojing Liu |
author_facet |
Bocheng Ding Weiqing Xu Ruichang Wu Yunfei Feng Lifang Tian Xiaohong Li Jianye Huang Zhi Liu Xiaojing Liu |
author_sort |
Bocheng Ding |
title |
A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser |
title_short |
A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser |
title_full |
A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser |
title_fullStr |
A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser |
title_full_unstemmed |
A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser |
title_sort |
composite velocity map imaging spectrometer for ions and 1 kev electrons at the shanghai soft x-ray free-electron laser |
publisher |
MDPI AG |
publishDate |
2021 |
url |
https://doaj.org/article/fe5b12ff1c794f5bbcd41838343fc26d |
work_keys_str_mv |
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