Analysis of Repair Mechanisms following an Induced Double-Strand Break Uncovers Recessive Deleterious Alleles in the <named-content content-type="genus-species">Candida albicans</named-content> Diploid Genome

Analysis of Repair Mechanisms following an Induced Double-Strand Break Uncovers Recessive Deleterious Alleles in the <named-content content-type="genus-species">Candida albicans</named-content> Diploid Genome

ABSTRACT The diploid genome of the yeast Candida albicans is highly plastic, exhibiting frequent loss-of-heterozygosity (LOH) events. To provide a deeper understanding of the mechanisms leading to LOH, we investigated the repair of a unique DNA double-strand break (DSB) in the laboratory C. albicans...

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Autores principales: Adeline Feri, Raphaël Loll-Krippleber, Pierre-Henri Commere, Corinne Maufrais, Natacha Sertour, Katja Schwartz, Gavin Sherlock, Marie-Elisabeth Bougnoux, Christophe d’Enfert, Mélanie Legrand
Formato: article
Lenguaje:EN
Publicado: American Society for Microbiology 2016
Materias:
Microbiology
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Acceso en línea:https://doaj.org/article/feccf48840964070a85b792c14d5ae2d
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