A moving contact line as a rheometer for nanometric interfacial layers

The characterisation of interfacial layers, whose rheology can differ from the bulk, is important for the design of new materials. Here, Lhermerout et al. use the dynamics of a moving contact line to quantify the mechanical properties of a polymer thin film.

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Autores principales: Romain Lhermerout, Hugo Perrin, Etienne Rolley, Bruno Andreotti, Kristina Davitt
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2016
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Acceso en línea:https://doaj.org/article/fed7dca1d3ba4aa4a172de8f48c303c8
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