Fault prediagnosis of power electronic devices in urban new energy system

The new energy system with low environmental load will more and more reflect its superiority in urban design and planning. The state monitoring of power electronic devices used for power conversion in new energy system is of great significance to the stable operation of the whole city. The failure m...

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Autores principales:	Lingfeng Shao, Zhenyun Pan, Xiaoyu Xu, Yanhui Zhang
Formato:	article
Lenguaje:	EN
Publicado:	Elsevier 2021
Materias:	New energy systems with low environmental load Failure mechanism Accelerated aging Junction temperature calculation Thermal resistance network Electrical engineering. Electronics. Nuclear engineering TK1-9971
Acceso en línea:	https://doaj.org/article/ffe82f9721454611a45cf8bdfa04ac1a
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spelling	oai:doaj.org-article:ffe82f9721454611a45cf8bdfa04ac1a2021-11-26T04:33:57ZFault prediagnosis of power electronic devices in urban new energy system2352-484710.1016/j.egyr.2021.08.064https://doaj.org/article/ffe82f9721454611a45cf8bdfa04ac1a2021-11-01T00:00:00Zhttp://www.sciencedirect.com/science/article/pii/S2352484721006673https://doaj.org/toc/2352-4847The new energy system with low environmental load will more and more reflect its superiority in urban design and planning. The state monitoring of power electronic devices used for power conversion in new energy system is of great significance to the stable operation of the whole city. The failure mechanism and aging evolution process of IGBT modules are studied, and the failure types of IGBT devices are judged. An algorithm based on the thermal sensitive electrical parameter method and thermal resistance network method was proposed to identify aging types. Firstly, a healthy junction temperature model of IGBT based on the initial loss of turn-off was established in the double-pulse platform based on experimental data. Secondly, a thermal resistance network model of IGBT was established based on the datasheet. Finally, the accelerated aging of IGBT was carried out through the existing accelerated aging experimental platform of IGBT in the laboratory, and the aging parameters were imported into the above two models. The results show that the output results of the thermal resistance network model and the thermal parameter model are affected by the aging type, which provides a new solution for the aging type research of IGBT, and is of great value for the application of new energy system.Lingfeng ShaoZhenyun PanXiaoyu XuYanhui ZhangElsevierarticleNew energy systems with low environmental loadFailure mechanismAccelerated agingJunction temperature calculationThermal resistance networkElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENEnergy Reports, Vol 7, Iss , Pp 134-140 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	New energy systems with low environmental load Failure mechanism Accelerated aging Junction temperature calculation Thermal resistance network Electrical engineering. Electronics. Nuclear engineering TK1-9971
spellingShingle	New energy systems with low environmental load Failure mechanism Accelerated aging Junction temperature calculation Thermal resistance network Electrical engineering. Electronics. Nuclear engineering TK1-9971 Lingfeng Shao Zhenyun Pan Xiaoyu Xu Yanhui Zhang Fault prediagnosis of power electronic devices in urban new energy system
description	The new energy system with low environmental load will more and more reflect its superiority in urban design and planning. The state monitoring of power electronic devices used for power conversion in new energy system is of great significance to the stable operation of the whole city. The failure mechanism and aging evolution process of IGBT modules are studied, and the failure types of IGBT devices are judged. An algorithm based on the thermal sensitive electrical parameter method and thermal resistance network method was proposed to identify aging types. Firstly, a healthy junction temperature model of IGBT based on the initial loss of turn-off was established in the double-pulse platform based on experimental data. Secondly, a thermal resistance network model of IGBT was established based on the datasheet. Finally, the accelerated aging of IGBT was carried out through the existing accelerated aging experimental platform of IGBT in the laboratory, and the aging parameters were imported into the above two models. The results show that the output results of the thermal resistance network model and the thermal parameter model are affected by the aging type, which provides a new solution for the aging type research of IGBT, and is of great value for the application of new energy system.
format	article
author	Lingfeng Shao Zhenyun Pan Xiaoyu Xu Yanhui Zhang
author_facet	Lingfeng Shao Zhenyun Pan Xiaoyu Xu Yanhui Zhang
author_sort	Lingfeng Shao
title	Fault prediagnosis of power electronic devices in urban new energy system
title_short	Fault prediagnosis of power electronic devices in urban new energy system
title_full	Fault prediagnosis of power electronic devices in urban new energy system
title_fullStr	Fault prediagnosis of power electronic devices in urban new energy system
title_full_unstemmed	Fault prediagnosis of power electronic devices in urban new energy system
title_sort	fault prediagnosis of power electronic devices in urban new energy system
publisher	Elsevier
publishDate	2021
url	https://doaj.org/article/ffe82f9721454611a45cf8bdfa04ac1a
work_keys_str_mv	AT lingfengshao faultprediagnosisofpowerelectronicdevicesinurbannewenergysystem AT zhenyunpan faultprediagnosisofpowerelectronicdevicesinurbannewenergysystem AT xiaoyuxu faultprediagnosisofpowerelectronicdevicesinurbannewenergysystem AT yanhuizhang faultprediagnosisofpowerelectronicdevicesinurbannewenergysystem
_version_	1718409880460591104

Fault prediagnosis of power electronic devices in urban new energy system

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