ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS
In present work we report the one step electrodeposition of ZnX (X = Se y Te) thin films in acid solution. In order to establish the appropriate conditions for the electrodeposition, a voltammetric and photovoltammetric study on different substrates was previously performed. The films were analyzed...
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Sociedad Chilena de Química
2002
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oai:scielo:S0366-164420020004000132009-12-18ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMSRIVEROS,G.GÓMEZ,HHENRÍQUEZ,R.SSHREBLER,R.CÓRDOVA,R.MAROTTI,R. E.DALCHIELE,E.A. ZnSe ZnTe semiconductors electrodeposition In present work we report the one step electrodeposition of ZnX (X = Se y Te) thin films in acid solution. In order to establish the appropriate conditions for the electrodeposition, a voltammetric and photovoltammetric study on different substrates was previously performed. The films were analyzed by different techniques (SEM, EDS, XRD and optical reflectance). The composition of the ZnTe films was very close to the stoichiometric one, instead, ZnSe films presented a selenium excess that can be eliminated with a proper annealing. Optical reflectance characterization of ZnSe and ZnTe samples grown on titanium gave direct band gaps values of 2.64 eV and 2.27 eV, respectively, in agreement with those reported in the bibliography.info:eu-repo/semantics/openAccessSociedad Chilena de QuímicaBoletín de la Sociedad Chilena de Química v.47 n.4 20022002-12-01text/htmlhttp://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0366-16442002000400013en10.4067/S0366-16442002000400013 |
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Scielo Chile |
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Scielo Chile |
language |
English |
topic |
ZnSe ZnTe semiconductors electrodeposition |
spellingShingle |
ZnSe ZnTe semiconductors electrodeposition RIVEROS,G. GÓMEZ,H HENRÍQUEZ,R. SSHREBLER,R. CÓRDOVA,R. MAROTTI,R. E. DALCHIELE,E.A. ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS |
description |
In present work we report the one step electrodeposition of ZnX (X = Se y Te) thin films in acid solution. In order to establish the appropriate conditions for the electrodeposition, a voltammetric and photovoltammetric study on different substrates was previously performed. The films were analyzed by different techniques (SEM, EDS, XRD and optical reflectance). The composition of the ZnTe films was very close to the stoichiometric one, instead, ZnSe films presented a selenium excess that can be eliminated with a proper annealing. Optical reflectance characterization of ZnSe and ZnTe samples grown on titanium gave direct band gaps values of 2.64 eV and 2.27 eV, respectively, in agreement with those reported in the bibliography. |
author |
RIVEROS,G. GÓMEZ,H HENRÍQUEZ,R. SSHREBLER,R. CÓRDOVA,R. MAROTTI,R. E. DALCHIELE,E.A. |
author_facet |
RIVEROS,G. GÓMEZ,H HENRÍQUEZ,R. SSHREBLER,R. CÓRDOVA,R. MAROTTI,R. E. DALCHIELE,E.A. |
author_sort |
RIVEROS,G. |
title |
ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS |
title_short |
ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS |
title_full |
ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS |
title_fullStr |
ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS |
title_full_unstemmed |
ELECTRODEPOSITION AND CHARACTERIZATION OF ZnX (X=Se, Te) SEMICONDUCTOR THIN FILMS |
title_sort |
electrodeposition and characterization of znx (x=se, te) semiconductor thin films |
publisher |
Sociedad Chilena de Química |
publishDate |
2002 |
url |
http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0366-16442002000400013 |
work_keys_str_mv |
AT riverosg electrodepositionandcharacterizationofznxxsetesemiconductorthinfilms AT gomezh electrodepositionandcharacterizationofznxxsetesemiconductorthinfilms AT henriquezr electrodepositionandcharacterizationofznxxsetesemiconductorthinfilms AT sshreblerr electrodepositionandcharacterizationofznxxsetesemiconductorthinfilms AT cordovar electrodepositionandcharacterizationofznxxsetesemiconductorthinfilms AT marottire electrodepositionandcharacterizationofznxxsetesemiconductorthinfilms AT dalchieleea electrodepositionandcharacterizationofznxxsetesemiconductorthinfilms |
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1718438152440381440 |