RAMAN CHARACTERIZATION OF CuCr2-xSnxS4 SPINELS
ABSTRACT Polycrystalline thiospinels CuCr2-xSnxS4 (x = 0.4, 0.8, 1.0 and 1.4) were synthesized via conventional solid-state reaction. The samples were characterized by powder X-ray diffraction (XRD), energy-dispersive X-ray analysis (SEM-EDS) and Raman spectroscopy. All the samples were indexed in t...
Guardado en:
| Autores principales: | , , , |
|---|---|
| Lenguaje: | English |
| Publicado: |
Sociedad Chilena de Química
2019
|
| Materias: | |
| Acceso en línea: | http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0717-97072019000104285 |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| Sumario: | ABSTRACT Polycrystalline thiospinels CuCr2-xSnxS4 (x = 0.4, 0.8, 1.0 and 1.4) were synthesized via conventional solid-state reaction. The samples were characterized by powder X-ray diffraction (XRD), energy-dispersive X-ray analysis (SEM-EDS) and Raman spectroscopy. All the samples were indexed in the space group F d 3 ¯ m. The Raman spectra confirmed the structure of normal spinel type with five characteristic signals for the active modes in Raman. Magnetic measurements, performed for the phases with x = 0.8 and 1.0, showed irreversible antiferromagnetism with dominant ferromagnetism and spin glass behavior. |
|---|