RAMAN CHARACTERIZATION OF CuCr2-xSnxS4 SPINELS

ABSTRACT Polycrystalline thiospinels CuCr2-xSnxS4 (x = 0.4, 0.8, 1.0 and 1.4) were synthesized via conventional solid-state reaction. The samples were characterized by powder X-ray diffraction (XRD), energy-dispersive X-ray analysis (SEM-EDS) and Raman spectroscopy. All the samples were indexed in t...

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Autores principales: Valencia-Gálvez,P., Peña,O., Moris,S., Barahona,P.
Lenguaje:English
Publicado: Sociedad Chilena de Química 2019
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Acceso en línea:http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0717-97072019000104285
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