The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing

The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level li...

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Autores principales:	Kim,Junyoung, Park,Yongtae
Lenguaje:	English
Publicado:	Universidad Alberto Hurtado. Facultad de Economía y Negocios 2008
Materias:	score model patent innovation sector pattern
Acceso en línea:	http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-27242008000200004
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spelling	oai:scielo:S0718-272420080002000042009-07-20The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation LicensingKim,JunyoungPark,Yongtae score model patent innovation sector pattern The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB (National Technology Bank) score model of KTTC (Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator's organizations. This paper also introduces two new factors named as 'patent authorization stage' for classifying patent status and 'technology regime based industrial innovation pattern' for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing.info:eu-repo/semantics/openAccessUniversidad Alberto Hurtado. Facultad de Economía y NegociosJournal of technology management & innovation v.3 n.4 20082008-01-01text/htmlhttp://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-27242008000200004en10.4067/S0718-27242008000200004
institution	Scielo Chile
collection	Scielo Chile
language	English
topic	score model patent innovation sector pattern
spellingShingle	score model patent innovation sector pattern Kim,Junyoung Park,Yongtae The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
description	The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB (National Technology Bank) score model of KTTC (Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator's organizations. This paper also introduces two new factors named as 'patent authorization stage' for classifying patent status and 'technology regime based industrial innovation pattern' for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing.
author	Kim,Junyoung Park,Yongtae
author_facet	Kim,Junyoung Park,Yongtae
author_sort	Kim,Junyoung
title	The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
title_short	The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
title_full	The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
title_fullStr	The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
title_full_unstemmed	The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
title_sort	usefulness of patent stage and sectoral pattern in open innovation licensing
publisher	Universidad Alberto Hurtado. Facultad de Economía y Negocios
publishDate	2008
url	http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-27242008000200004
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The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing

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