A new polarimeter scheme based on solid state semiconductors

A new kind of polarimeter scheme is suggested using solid state semiconductors. The new approach is based on the modulation over the intensities of the diffracted beams through a two-dimensional chiral grating, reported recently. It will be demonstrated that at least four intensity measurements of n...

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Autor principal:	Castro Gutierrez,Heiner
Lenguaje:	English
Publicado:	Universidad de Tarapacá. 2012
Materias:	Polarization azimuth ellipticity light intensity chiral gratings
Acceso en línea:	http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-33052012000300004
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spelling	oai:scielo:S0718-330520120003000042013-01-07A new polarimeter scheme based on solid state semiconductorsCastro Gutierrez,Heiner Polarization azimuth ellipticity light intensity chiral gratings A new kind of polarimeter scheme is suggested using solid state semiconductors. The new approach is based on the modulation over the intensities of the diffracted beams through a two-dimensional chiral grating, reported recently. It will be demonstrated that at least four intensity measurements of no equivalent diffracted beams are needed in order to estimate the polarization state of the incident beam. The incident beam azimuth was varied by routing a linear polarizer lens mounting in a stepped motor. The intensities of four diffracted beams were measured using a screen, a CCD camera and some algorithms running in a computer. The LabVIEW development environment software was used for controlling the hardware and for presenting the results. MATLAB© was used for calculating the intensities of the diffracted beams and computing the azimuth of the incident beam. Although both the azimuth and ellipticity should be estimated, the experiments show that only the azimuth estimation yields accurate results. The ellipticity cannot be estimated with precision. The error on the azimuth estimation depends on the variation in the power of the incident beam. It was found that the azimuth estimation is accurate between [0,140) and (150,180] degrees. The cause of huge errors in the azimuth found between 140 and 150 degrees are kept unknown.info:eu-repo/semantics/openAccessUniversidad de Tarapacá.Ingeniare. Revista chilena de ingeniería v.20 n.3 20122012-12-01text/htmlhttp://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-33052012000300004en10.4067/S0718-33052012000300004
institution	Scielo Chile
collection	Scielo Chile
language	English
topic	Polarization azimuth ellipticity light intensity chiral gratings
spellingShingle	Polarization azimuth ellipticity light intensity chiral gratings Castro Gutierrez,Heiner A new polarimeter scheme based on solid state semiconductors
description	A new kind of polarimeter scheme is suggested using solid state semiconductors. The new approach is based on the modulation over the intensities of the diffracted beams through a two-dimensional chiral grating, reported recently. It will be demonstrated that at least four intensity measurements of no equivalent diffracted beams are needed in order to estimate the polarization state of the incident beam. The incident beam azimuth was varied by routing a linear polarizer lens mounting in a stepped motor. The intensities of four diffracted beams were measured using a screen, a CCD camera and some algorithms running in a computer. The LabVIEW development environment software was used for controlling the hardware and for presenting the results. MATLAB© was used for calculating the intensities of the diffracted beams and computing the azimuth of the incident beam. Although both the azimuth and ellipticity should be estimated, the experiments show that only the azimuth estimation yields accurate results. The ellipticity cannot be estimated with precision. The error on the azimuth estimation depends on the variation in the power of the incident beam. It was found that the azimuth estimation is accurate between [0,140) and (150,180] degrees. The cause of huge errors in the azimuth found between 140 and 150 degrees are kept unknown.
author	Castro Gutierrez,Heiner
author_facet	Castro Gutierrez,Heiner
author_sort	Castro Gutierrez,Heiner
title	A new polarimeter scheme based on solid state semiconductors
title_short	A new polarimeter scheme based on solid state semiconductors
title_full	A new polarimeter scheme based on solid state semiconductors
title_fullStr	A new polarimeter scheme based on solid state semiconductors
title_full_unstemmed	A new polarimeter scheme based on solid state semiconductors
title_sort	new polarimeter scheme based on solid state semiconductors
publisher	Universidad de Tarapacá.
publishDate	2012
url	http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-33052012000300004
work_keys_str_mv	AT castrogutierrezheiner anewpolarimeterschemebasedonsolidstatesemiconductors AT castrogutierrezheiner newpolarimeterschemebasedonsolidstatesemiconductors
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A new polarimeter scheme based on solid state semiconductors

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