Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method

ABSTRACT The specification of the most convenient cultivars based on multiple trait indices is a new approach in durum wheat (Triticum durum Desf.) adaptation and stability studies. This approach helps to define the best cultivar based on multiple traits and multiple locations because cultivars are...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autor principal:	Kendal,Enver
Lenguaje:	English
Publicado:	Instituto de Investigaciones Agropecuarias, INIA 2019
Materias:	Durum cultivar multiple environment trait genotype × yield × trait.
Acceso en línea:	http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-58392019000400512
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:scielo:S0718-58392019000400512
record_format	dspace
spelling	oai:scielo:S0718-583920190004005122019-11-19Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot methodKendal,Enver Durum cultivar multiple environment trait genotype × yield × trait. ABSTRACT The specification of the most convenient cultivars based on multiple trait indices is a new approach in durum wheat (Triticum durum Desf.) adaptation and stability studies. This approach helps to define the best cultivar based on multiple traits and multiple locations because cultivars are affected by unpredictable climatic conditions. Some traits (ears per square meter, spike length, number of grains per spike, spike yield, and leaf chlorophyll content among others) can be produced for primary breeding purposes because they are influenced by environmental factors and indirectly affect grain yield and quality. Therefore, in the present study, the new genotype × yield trait (GYT) biplot approach was used to identify the best cultivar among 10 durum wheat cultivars based on multiple environments (8) and multiple traits (18). Cultivar ranking was examined by a superiority index that combined yield and other target traits with the GYT biplot. The general adaptability of each cultivar in terms of all the traits indicated differences based on environment means, and significant differences were found between varieties for the GYT biplot. In the GYT biplot, yield-trait combinations clearly indicated the most stable cultivars, whereas in the genotype × trait (GT) biplot, the best cultivars were not defined for all traits. ‘Sariçanak’ was ranked as the best combination of physio-morphological traits with grain yield, ‘Zühre’ was the best for more quality traits, and ‘Güneyyildizi’ was the best for both physio-morphological and quality traits in the GYT biplot. The GYT biplot combines traits with yield and can help the visual identification of the best cultivars; it is better than the GT biplot method.info:eu-repo/semantics/openAccessInstituto de Investigaciones Agropecuarias, INIAChilean journal of agricultural research v.79 n.4 20192019-12-01text/htmlhttp://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-58392019000400512en10.4067/S0718-58392019000400512
institution	Scielo Chile
collection	Scielo Chile
language	English
topic	Durum cultivar multiple environment trait genotype × yield × trait.
spellingShingle	Durum cultivar multiple environment trait genotype × yield × trait. Kendal,Enver Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method
description	ABSTRACT The specification of the most convenient cultivars based on multiple trait indices is a new approach in durum wheat (Triticum durum Desf.) adaptation and stability studies. This approach helps to define the best cultivar based on multiple traits and multiple locations because cultivars are affected by unpredictable climatic conditions. Some traits (ears per square meter, spike length, number of grains per spike, spike yield, and leaf chlorophyll content among others) can be produced for primary breeding purposes because they are influenced by environmental factors and indirectly affect grain yield and quality. Therefore, in the present study, the new genotype × yield trait (GYT) biplot approach was used to identify the best cultivar among 10 durum wheat cultivars based on multiple environments (8) and multiple traits (18). Cultivar ranking was examined by a superiority index that combined yield and other target traits with the GYT biplot. The general adaptability of each cultivar in terms of all the traits indicated differences based on environment means, and significant differences were found between varieties for the GYT biplot. In the GYT biplot, yield-trait combinations clearly indicated the most stable cultivars, whereas in the genotype × trait (GT) biplot, the best cultivars were not defined for all traits. ‘Sariçanak’ was ranked as the best combination of physio-morphological traits with grain yield, ‘Zühre’ was the best for more quality traits, and ‘Güneyyildizi’ was the best for both physio-morphological and quality traits in the GYT biplot. The GYT biplot combines traits with yield and can help the visual identification of the best cultivars; it is better than the GT biplot method.
author	Kendal,Enver
author_facet	Kendal,Enver
author_sort	Kendal,Enver
title	Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method
title_short	Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method
title_full	Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method
title_fullStr	Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method
title_full_unstemmed	Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method
title_sort	comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method
publisher	Instituto de Investigaciones Agropecuarias, INIA
publishDate	2019
url	http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-58392019000400512
work_keys_str_mv	AT kendalenver comparingdurumwheatcultivarsbygenotypeyieldtraitandgenotypetraitbiplotmethod
_version_	1714205392632807424

Comparing durum wheat cultivars by genotype × yield ×trait and genotype × trait biplot method

Ejemplares similares