QTL mapping for the resistance to yellow rust race CYR34 in triticale
ABSTRACT Yellow rust is an important destructive fungal disease caused by Puccinia striiformis in small grain cereals, and the prevalent Chinese yellow race CYR34 has recently become widespread in China. To detect quantitative trait loci (QTLs) responsible for resistance to CYR34 in triticale (×Trit...
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Autores principales: | , , , |
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Lenguaje: | English |
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Instituto de Investigaciones Agropecuarias, INIA
2020
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Acceso en línea: | http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-58392020000300405 |
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