Defect detection in atomic-resolution images via unsupervised learning with translational invariance

por Yueming Guo, Sergei V. Kalinin, Hui Cai, Kai Xiao, Sergiy Krylyuk, Albert V. Davydov, Qianying Guo, Andrew R. Lupini
Publicado 2021

On-the-fly closed-loop materials discovery via Bayesian active learning

por A. Gilad Kusne, Heshan Yu, Changming Wu, Huairuo Zhang, Jason Hattrick-Simpers, Brian DeCost, Suchismita Sarker, Corey Oses, Cormac Toher, Stefano Curtarolo, Albert V. Davydov, Ritesh Agarwal, Leonid A. Bendersky, Mo Li, Apurva Mehta, Ichiro Takeuchi
Publicado 2020