Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction

por Felisa Berenguer, Giorgio Pettinari, Marco Felici, Nilanthy Balakrishnan, Jesse N. Clark, Sylvain Ravy, Amalia Patané, Antonio Polimeni, Gianluca Ciatto
Publicado 2020

Continuous scanning for Bragg coherent X-ray imaging

por Ni Li, Maxime Dupraz, Longfei Wu, Steven J. Leake, Andrea Resta, Jérôme Carnis, Stéphane Labat, Ehud Almog, Eugen Rabkin, Vincent Favre-Nicolin, Frédéric-Emmanuel Picca, Felisa Berenguer, Rim van de Poll, Jan P. Hofmann, Alina Vlad, Olivier Thomas, Yves Garreau, Alessandro Coati, Marie-Ingrid Richard
Publicado 2020