High Pressure Deuterium Passivation of Charge Trapping Layer for Nonvolatile Memory Applications

par Jae-Young Sung, Jun-Kyo Jeong, Woon-San Ko, Jun-Ho Byun, Hi-Deok Lee, Ga-Won Lee
Publié 2021

Physical and Electrical Analysis of Poly-Si Channel Effect on SONOS Flash Memory

par Jun-Kyo Jeong, Jae-Young Sung, Woon-San Ko, Ki-Ryung Nam, Hi-Deok Lee, Ga-Won Lee
Publié 2021

Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

par Sung-Kyu Kwon, Hyuk-Min Kwon, In-Shik Han, Jae-Hyung Jang, Sun-Ho Oh, Hyeong-Sub Song, Byoung-Seok Park, Yi-Sun Chung, Jung-Hwan Lee, Si-Bum Kim, Ga-Won Lee, Hi-Deok Lee
Publié 2018