Ordered fragmentation of oxide thin films at submicron scale

por L. Guo, Y. Ren, L. Y. Kong, W. K. Chim, S. Y. Chiam
Publicado 2016

Electronic structure of SrSn2As2 near the topological critical point

por L.-Y. Rong, J.-Z. Ma, S.-M. Nie, Z.-P. Lin, Z.-L. Li, B.-B. Fu, L.-Y. Kong, X.-Z. Zhang, Y.-B. Huang, H.-M. Weng, T. Qian, H. Ding, R.-Z. Tai
Publicado 2017