Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry

por James Keeley, Joshua Freeman, Karl Bertling, Yah Leng Lim, Reshma A. Mohandas, Thomas Taimre, Lianhe H. Li, Dragan Indjin, Aleksandar D. Rakić, Edmund H. Linfield, A. Giles Davies, Paul Dean
Publicado 2017