Interface Adhesion and Structural Characterization of Rolled-up GaAs/In0.2Ga0.8As Multilayer Tubes by Coherent Phonon Spectroscopy

por D. Brick, V. Engemaier, Y. Guo, M. Grossmann, G. Li, D. Grimm, O. G. Schmidt, M. Schubert, V. E. Gusev, M. Hettich, T. Dekorsy
Publicado 2017