Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3

por Verdad C. Agulto, Toshiyuki Iwamoto, Hideaki Kitahara, Kazuhiro Toya, Valynn Katrine Mag-usara, Masayuki Imanishi, Yusuke Mori, Masashi Yoshimura, Makoto Nakajima
Publicado 2021