Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose

por Zhen Chen, Michal Odstrcil, Yi Jiang, Yimo Han, Ming-Hui Chiu, Lain-Jong Li, David A. Muller
Publicado 2020

Additive manufacturing assisted van der Waals integration of 3D/3D hierarchically functional nanostructures

por Jui-Han Fu, Ang-Yu Lu, Nathan J. Madden, Christine C. Wu, Yen-Chang Chen, Ming-Hui Chiu, Khalid Hattar, Jessica A. Krogstad, Stanley S. Chou, Lain-Jong Li, Jing Kong, Vincent Tung
Publicado 2020