Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors

por Yuhei Miyauchi, Satoru Konabe, Feijiu Wang, Wenjin Zhang, Alexander Hwang, Yusuke Hasegawa, Lizhong Zhou, Shinichiro Mouri, Minglin Toh, Goki Eda, Kazunari Matsuda
Publicado 2018