An RF Stress-Based Thermal Shock Test Method for a CMOS Power Amplifier

por Shaohua Zhou, Jian Wang
Publicado 2021

Experimentally investigating the performance degradations of the CMOS PA at different temperatures

por Zhao He, Shaohua Zhou, Meining Nie
Publicado 2021

Robust charge-density wave strengthened by electron correlations in monolayer 1T-TaSe2 and 1T-NbSe2

por Yuki Nakata, Katsuaki Sugawara, Ashish Chainani, Hirofumi Oka, Changhua Bao, Shaohua Zhou, Pei-Yu Chuang, Cheng-Maw Cheng, Tappei Kawakami, Yasuaki Saruta, Tomoteru Fukumura, Shuyun Zhou, Takashi Takahashi, Takafumi Sato
Publicado 2021