Probing the edge-related properties of atomically thin MoS2 at nanoscale

por Teng-Xiang Huang, Xin Cong, Si-Si Wu, Kai-Qiang Lin, Xu Yao, Yu-Han He, Jiang-Bin Wu, Yi-Fan Bao, Sheng-Chao Huang, Xiang Wang, Ping-Heng Tan, Bin Ren
Publicado 2019