Piezoresponse force microscopy and nanoferroic phenomena

Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical...

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Autores principales: Alexei Gruverman, Marin Alexe, Dennis Meier
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/02c6872dc5104de8b0ed9ee52ea360e2
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